Mechanisms of atmospheric neutron-induced single event upsets in nanometric SOI and bulk SRAM devices based on experiment-verified simulation tool
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
https://iopscience.iop.org/article/10.1088/1674-1056/27/6/066105/pdf
Reference13 articles.
1. The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs
2. Real-Time Soft-Error Testing Results of 45-nm, High-K Metal Gate, Bulk CMOS SRAMs
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