Mechanisms and shielding characteristics of alpha particle-induced soft errors in 28 and 40 nm configuration memories of SRAM-based FPGAs-Reference-Cited by-同舟云学术

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Mechanisms and shielding characteristics of alpha particle-induced soft errors in 28 and 40 nm configuration memories of SRAM-based FPGAs

Published:2023-01 Issue: Volume:140 Page:114861
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Luo Jun-Yang,Zhang Hong,Zhang Zhan-Gang,Lei Zhi-Feng,Guo Jin-Long,Du Guang-Hua,Peng Chao,He YuJuan,Zhong Xiang-Li

Funder

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. Introductory Nuclear Physics;Wong,1955

2. Alpha particle-induced soft errors in dynamic memories;May;IEEE Trans. Electron Devices,1979

3. Effects of atmospheric neutrons and natural contamination on advanced microelectronic memories;Wrobel;Appl. Phys. Lett.,2008

4. Modelling of alpha particle induced soft errors in dynamic random access memories (DRAM);Haque;Radiat. Prot. Dosim.,1990

5. Soft error trends in advanced silicon technology nodes;Bhuva,2019

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