Observation of nonconservation characteristics of radio frequency noise mechanism of 40-nm n-MOSFET
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
https://iopscience.iop.org/article/10.1088/1674-1056/27/2/027201/pdf
Reference21 articles.
1. High-frequency noise in nanoscale metal oxide semiconductor field effect transistors
2. Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications
3. CMOS Small-Signal and Thermal Noise Modeling at High Frequencies
4. High-Frequency Noise Modeling of MOSFETs for Ultra Low-Voltage RF Applications
5. RF Small-Signal and Noise Modeling Including Parameter Extraction of Nanoscale MOSFET From Weak to Strong Inversion
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