DLTS studies of deep traps in CdTe
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,Condensed Matter Physics
Link
http://stacks.iop.org/0022-3719/15/i=19/a=001/pdf
Reference14 articles.
1. A simple signal analyser for deep-level trap spectroscopy
2. Fe ion dose dependence of deep levels in Si p+-n junction
3. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
4. Description of anomalous centers in chlorine doped-CdTe by a non-purely electronic model
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