X-ray nanometer focusing at the SSRF based on a multilayer Laue lens-Reference-Cited by-同舟云学术

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X-ray nanometer focusing at the SSRF based on a multilayer Laue lens

Published:2015-12 Issue:12 Volume:39 Page:128001
ISSN:1674-1137
Container-title:Chinese Physics C
language:
Short-container-title:Chinese Phys. C

Author:

Zhu Jing-Tao,Tu Yu-Chun,Li Hao-Chuan,Yue Shuai-Peng,Huang Qiu-Shi,Li Ai-Guo,Wang Zhan-Shan

Publisher

IOP Publishing

Subject

Astronomy and Astrophysics,Instrumentation,Nuclear and High Energy Physics

Link

https://iopscience.iop.org/article/10.1088/1674-1137/39/12/128001/pdf

Reference10 articles.

1. Breaking the 10 nm barrier in hard-X-ray focusing

2. Soft X-ray microscopy and spectroscopy at the molecular environmental science beamline at the Advanced Light Source

3. Efficient focusing of hard x rays to 25nm by a total reflection mirror

4. Hard x-ray nanoprobe based on refractive x-ray lenses

5. Soft X-ray microscopy at a spatial resolution better than 15 nm

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Multilayer Optics for Synchrotron Applications;Advanced Materials Technologies;2024-04-20

2. 原子层沉积与聚焦离子束切片法制备X射线波带片;Acta Optica Sinica;2023

3. Hard X-ray focusing resolution and efficiency test with a thickness correction multilayer Laue lens;Nuclear Science and Techniques;2022-09

4. X射线衍射极限纳米聚焦的前沿进展;Acta Optica Sinica;2022

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