Hard X-ray focusing resolution and efficiency test with a thickness correction multilayer Laue lens
Author:
Publisher
Springer Science and Business Media LLC
Subject
Nuclear Energy and Engineering,Nuclear and High Energy Physics
Link
https://link.springer.com/content/pdf/10.1007/s41365-022-01102-1.pdf
Reference26 articles.
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2. H.L. Xie, B. Deng, G.H. Du et al., Methodology development and application of X-ray imaging beamline at SSRF. Nucl. Sci. Tech. 31, 102 (2020). https://doi.org/10.1007/s41365-020-00805-7
3. G.X. Wei, S.X. Zhang, Z. Li et al., Multi-modality measurement and comprehensive analysis of hepatocellular carcinoma using synchrotron-based microscopy and spectroscopy. Nucl. Sci. Tech. 32, 102 (2021). https://doi.org/10.1007/s41365-021-00927-6
4. H.F. Yan, R. Conley, N. Bouet et al., Hard x-ray nanofocusing by multilayer Laue lenses. J. Phys. D Appl. Phys. 47, 263001 (2014). https://doi.org/10.1088/0022-3727/47/26/263001
5. H.C. Kang, G.B. Stephenson, C. Liu et al., Synchrotron x-ray study of multilayers in Laue geometry. Proceedings of SPIE 5537, X-Ray Sources and Optics, (3 November 2004). https://doi.org/10.1117/12.560173
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