Surface sensitivity of four-probe STM resistivity measurements of bulk ZnO correlated to XPS-Reference-Cited by-同舟云学术

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Surface sensitivity of four-probe STM resistivity measurements of bulk ZnO correlated to XPS

Published:2017-08-16 Issue:38 Volume:29 Page:384001
ISSN:0953-8984
Container-title:Journal of Physics: Condensed Matter
language:
Short-container-title:J. Phys.: Condens. Matter

Author:

Lord Alex M^ORCID,Evans Jonathan E,Barnett Chris J^ORCID,Allen Martin W,Barron Andrew R^ORCID,Wilks Steve P

Funder

Sêr Cymru II

ARB by the Welsh Government Ser Cymru Programme

The Robert A Welch Foundation

Engineering and Physical Sciences Research Council-funded Impact Acceleration Account

Publisher

IOP Publishing

Subject

Condensed Matter Physics,General Materials Science

Link

http://iopscience.iop.org/article/10.1088/1361-648X/aa7dc8/pdf

Reference68 articles.

1. MICRO-FOUR-POINT PROBES IN A UHV SCANNING ELECTRON MICROSCOPE FOR IN-SITU SURFACE-CONDUCTIVITY MEASUREMENTS

2. Independently driven four-tip probes for conductivity measurements in ultrahigh vacuum

3. ELECTRICAL CONDUCTION THROUGH SURFACE SUPERSTRUCTURES MEASURED BY MICROSCOPIC FOUR-POINT PROBES

4. Nanoscale electron transport at the surface of a topological insulator

5. Imaging, single atom contact and single atom manipulations at low temperature using the new ScientaOmicron LT-UHV-4 STM

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