Study of the properties of FZO thin films deposited by USP using a milled Zn precursor-Reference-Cited by-同舟云学术

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Study of the properties of FZO thin films deposited by USP using a milled Zn precursor

Published:2023-10-25 Issue: Volume: Page:
ISSN:
Container-title:2023 20th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)
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Author:

Barrón Gabriela B.¹,Maldonado A.²,de la L. Olvera A M.²,Balcazar L. M.³

Affiliation:

1. CINVESTAV-IPN. Instituto Politécnico Nacional 2508, San Pedro Zacatenco, Gustavo A. Madero,Programa de Doctorado en Nanociencias y Nanotecnología,Ciudad de México,CDMX,07360

2. CINVESTAV-IPN. Instituto Politécnico Nacional 2508, Zacatenco, Gustavo A. Madero,Departamento de Ingeniería Eléctrica-SEES,Ciudad de México, CDMX,07360

3. CINVESTAV-IPN. Instituto Politécnico Nacional 2508, Zacatenco, Gustavo A. Madero,Programa de Doctorado en Nanociencias y Nanotecnología,Ciudad de México,CDMX,07360

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10332458/10332802/10332835.pdf?arnumber=10332835

Reference17 articles.

1. Transparent Conducting Oxide Films for Various Applications: A Review

2. Surface sensitivity of four-probe STM resistivity measurements of bulk ZnO correlated to XPS

3. Transparent Conducting Coatings

4. A Short Review on Properties and Applications of Zinc Oxide Based Thin Films and Devices : ZnO as a promising material for applications in electronics, optoelectronics, biomedical and sensors

5. Morphological, Structural, and Charge Transfer Properties of F-Doped ZnO: A Spectroscopic Investigation

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