Theoretical modeling of charge trapping in crystalline and amorphous Al2O3-Reference-Cited by-同舟云学术

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Theoretical modeling of charge trapping in crystalline and amorphous Al2O3

Published:2017-07-06 Issue:31 Volume:29 Page:314005
ISSN:0953-8984
Container-title:Journal of Physics: Condensed Matter
language:
Short-container-title:J. Phys.: Condens. Matter

Author:

Dicks Oliver A,Shluger Alexander L

Funder

Engineering and Physical Sciences Research Council

Argonne National Laboratory

Publisher

IOP Publishing

Subject

Condensed Matter Physics,General Materials Science

Link

http://iopscience.iop.org/article/10.1088/1361-648X/aa7767/pdf

Reference75 articles.

1. Robust Periodic Hartree−Fock Exchange for Large-Scale Simulations Using Gaussian Basis Sets

2. Applying Complementary Trap Characterization Technique to Crystalline $\gamma$-Phase-$\hbox{Al}_{2} \hbox{O}_{3}$ for Improved Understanding of Nonvolatile Memory Operation and Reliability

3. Charge Trapping Memory Characteristics of Amorphous-Indium–Gallium–Zinc Oxide Thin-Film Transistors With Defect-Engineered Alumina Dielectric

4. Effect of Alumina Buffers on the Stability of Top-Gate Amorphous InGaZnO Thin-Film Transistors on Flexible Substrates

5. Quantum-chemical simulations of free and bound hole polarons in corundum crystal

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1. Single-crystalline metal-oxide dielectrics for top-gate 2D transistors;Nature;2024-08-07

2. Revealing microstructure and the associated corrosion mechanism of Al/amorphous Al2O3/Al tri-layer coating deposited on depleted uranium by magnetron sputtering;Applied Surface Science;2024-06

3. The Role of Carrier Injection in the Breakdown Mechanism of Amorphous Al₂O₃ Layers;IEEE Electron Device Letters;2024-02

4. Pure and hybrid DFT computations and compton spectroscopy measurements of Al2O3;AIP Conference Proceedings;2024

5. On the Structure of Oxygen Deficient Amorphous Oxide Films;Advanced Science;2023-12-26

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