A new absolute diffuse reflectance measurement in the near-IR region based on the modified double-sphere method
Author:
Publisher
IOP Publishing
Subject
General Engineering
Link
http://stacks.iop.org/0026-1394/46/i=4/a=S10/pdf
Reference6 articles.
1. Evaluation of Absolute Reflectance for Standardization Purposes
2. Use of an Auxiliary Sphere with a Spectroreflectometer to Obtain Absolute Reflectance
3. Establishing a scale of directional-hemispherical reflectance factor I: The Van den Akker method
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