Correction of port reflection effect for integrating sphere-based reflection measurements
Author:
Publisher
IOP Publishing
Subject
General Engineering
Link
http://stacks.iop.org/0026-1394/50/i=5/a=472/pdf
Reference18 articles.
1. Requirements for Reflection Standards and the Measurement of Their Reflection Values
2. Establishing a scale of directional-hemispherical reflectance factor I: The Van den Akker method
3. Accurate diffuse reflection measurements in the infrared spectral range
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