Measurement of the spectral reflectance of samples of absorbing coatings in the wavelength range 350–1100 nm with angles of incidence of the radiation 0

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Measurement of the spectral reflectance of samples of absorbing coatings in the wavelength range 350–1100 nm with angles of incidence of the radiation 0–90°

Published:2012-09 Issue:6 Volume:55 Page:666-671
ISSN:0543-1972
Container-title:Measurement Techniques
language:en
Short-container-title:Meas Tech

Author:

Bulygin F. V.,Volkov I. A.,Vtulkin P. P.,Marchenko S. N.

Publisher

Springer Science and Business Media LLC

Subject

Applied Mathematics,Instrumentation

Link

http://link.springer.com/content/pdf/10.1007/s11018-012-0018-8.pdf

Reference13 articles.

1. European Photovoltaic Industry Association (EPIA), www.epia.org , accessed Feb. 11, 2012.

2. Tomsk Polytechnical University, http://portal.tpu.ru.SHARED/n/NASA/Education/NiVIE , accessed Feb.11, 2012.

3. CIE 130–98, Practical Methods for the Measurement of Reflectance and Transmittance. Technical Report.

4. V. S. Ivanov et al., Foundations of Opto-Electronic Measurements in Photonics: Textbook [in Russian], Logos, Moscow (2004).

5. D. K. Edwards et al., “Integrating sphere for imperfectly diffuse samples,” J. Opt. Soc. Amer., 51, 1279–1288 (1961).

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