A specimen holder for film thickness measurement-Reference-Cited by-同舟云学术

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A specimen holder for film thickness measurement

Published:1964-07 Issue:7 Volume:41 Page:474-474
ISSN:0950-7671
Container-title:Journal of Scientific Instruments
language:
Short-container-title:J. Sci. Instrum.

Author:

Gould P A,Pick U

Publisher

IOP Publishing

Subject

General Medicine

Reference3 articles.

1. A Sensitive Adjustment for Interferometer Plates

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A simple apparatus for film thickness measurements;Journal of Physics E: Scientific Instruments;1985-07

2. BIBLIOGRAPHY;Intermetallic Semiconducting Films;1970

3. A new interferometric method for measuring the thickness of thick films;Journal of Scientific Instruments;1967-05

4. Interferometer Jig for Film Thickness Measurement;Review of Scientific Instruments;1967-02

5. The resistivity of evaporated permalloy films;Vacuum;1965-08

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