A simple apparatus for film thickness measurements
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/18/i=7/a=008/pdf
Reference5 articles.
1. A specimen holder for film thickness measurement
2. A Sensitive Adjustment for Interferometer Plates
3. Stage Interferometer for Microinterferometry
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1. Highly accurate film thickness measurement based on automatic fringe analysis;Optik;2012-08
2. Sources of Inhomogeneity and Their Effects on the Asymmetry of the Ferromagnetic Resonance Lineshapes of Single Crystal Nickel Films;Japanese Journal of Applied Physics;1991-08-15
3. Influence of the nature of the interface on the spin wave resonance spectra of single-crystal nickel films;Thin Solid Films;1991-03
4. On the broadening of the linewidth in the spin-wave spectra of single crystal nickel films;Vacuum;1991-01
5. The angular dependence of the main spin-wave resonance linewidth in ferromagnetic nickel films;Physica B: Condensed Matter;1990-07
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