Atomic structure and composition distribution in wetting layers and islands of germanium grown on silicon (001) substrates-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Atomic structure and composition distribution in wetting layers and islands of germanium grown on silicon (001) substrates

Published:2015-11-10 Issue:48 Volume:26 Page:485702
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Brehm Moritz,Groiss Heiko,Bauer Günther,Gerthsen Dagmar,Clarke Roy,Paltiel Yossi,Yacoby Yizhak

Funder

Israel Science Foundation

US Department of Energy

Austrian Science Fund (FWF):

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/26/i=48/a=485702/pdf

Reference70 articles.

1. Growth and self-organization of SiGe nanostructures

2. Ge dots and nanostructures grown epitaxially on Si

3. Mechanisms of Stranski-Krastanov growth

4. Surface energetics and structure of the Ge wetting layer on Si(100)

5. Compositional mapping of semiconductor quantum dots and rings

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study on crystal growth of Ge/Si quantum dots at different Ge deposition by using magnetron sputtering technique;Scientific Reports;2023-05-09

2. Study of intermixing effects in Ge/Si(001) growth using kinetic Monte Carlo simulations;Journal of Crystal Growth;2022-04

3. Peculiarities and evolution of Raman spectra of multilayer Ge/Si(001) heterostructures containing arrays of low‐temperature MBE‐grown Ge quantum dots of different size and number density: Experimental studies and numerical simulations;Journal of Raman Spectroscopy;2022-02-21

4. High‐Resolution Crystal Truncation Rod Scattering: Application to Ultrathin Layers and Buried Interfaces;Advanced Materials Interfaces;2020-02-20

5. Dislocation Analysis in SiGe Heterostructures by Large-Angle Convergent Beam Electron Diffraction;Crystals;2019-12-19

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3