A single-atom sharp iridium tip as an emitter of gas field ion sources-Reference-Cited by-同舟云学术

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A single-atom sharp iridium tip as an emitter of gas field ion sources

Published:2009-07-28 Issue:33 Volume:20 Page:335701
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Kuo Hong-Shi,Hwang Ing-Shouh,Fu Tsu-Yi,Hwang Ying-Siang,Lu Yi-Hsien,Lin Chun-Yueh,Hou Jin-Long,Tsong Tien T

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/20/i=33/a=335701/pdf

Reference28 articles.

1. High‐resolution focused ion beams

2. Ion beams and their applications in high-resolution probe formation

3. Applications of the FIB lift-out technique for TEM specimen preparation

4. Progress in extreme ultraviolet mask repair using a focused ion beam

5. Room-temperature coherent coupling of single spins in diamond

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1. Creation and Characterization of an Atomically Sharp Single/Trimer Atom Ir/W(111) Tip by Thermal Field-Assisted Faceting;Microscopy and Microanalysis;2021-07-23

2. Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations;Ultramicroscopy;2020-11

3. Selective production of hydrogen ion species at atomically designed nanotips;Ultramicroscopy;2018-03

4. Characteristics of krypton ion emission from a gas field ionization source with a single atom tip;Japanese Journal of Applied Physics;2017-04-25

5. Scanning Voltage Microscopy for Emerging Electronic and Photonic Devices: Integrating nanotips with a single atom end for SVM;IEEE Nanotechnology Magazine;2017-03

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