Characteristics of krypton ion emission from a gas field ionization source with a single atom tip
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/56/i=6S1/a=06GC01/pdf
Reference41 articles.
1. Handbook of Microscopy for Nanotechnology
2. Handbook of Charged Particle Optics
3. Focused ion beams in microfabrication (invited)
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1. Roadmap for focused ion beam technologies;Applied Physics Reviews;2023-12-01
2. Imaging and milling resolution of light ion beams from helium ion microscopy and FIBs driven by liquid metal alloy ion sources;Beilstein Journal of Nanotechnology;2020-11-18
3. Characteristics Comparison of Neon, Argon, and Krypton Ion Emissions from Gas Field Ionization Sources with a Single-Atom Tip;Microscopy and Microanalysis;2019-01-30
4. Ion Microscopy;Springer Handbook of Microscopy;2019
5. Contrast Differences Between Nitrogen and Helium Ion Induced Secondary Electron Images Beyond Instrument Effects;MRS Advances;2018-01-10
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