Selective production of hydrogen ion species at atomically designed nanotips-Reference-Cited by-同舟云学术

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Selective production of hydrogen ion species at atomically designed nanotips

Published:2018-03 Issue: Volume:186 Page:42-48
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Moritani Hironori,Urban Radovan,Nova Kyle,Salomons Mark,Wolkow Robert,Pitters Jason

Funder

National Research Council

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference25 articles.

1. The history and development of the helium ion microscope;Economou;Scanning,2012

2. The ALIS He ion source and its application to high resolution microscopy;Hill;Phys. Procedia,2008

3. Neon ion beam lithography (NIBL);Winston;Nano Lett.,2011

4. F. Aramaki, T. Ogawa, O. Matsuda, T. Kozakai, Y. Sugiyama, H. Oba, A. Yasaka, T. Amano, H. Shigemura, O. Suga, In Development of new FIB technology for EUVL mask repair, 2011, pp. 79691C-79691C-7.

5. F. Aramaki, T. Kozakai, O. Matsuda, A. Yasaka, S. Yoshikawa, K. Kanno, H. Miyashita, N. Hayashi, In Performance of GFIS mask repair system for various mask materials, 2014, pp. 92350F-92350F-8.

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1. Bright sources under the projection microscope: using an insulating crystal on a conductor as electron source;The European Physical Journal Applied Physics;2022

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