Atomic force and shear force based tip-enhanced Raman spectroscopy and imaging-Reference-Cited by-同舟云学术

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Atomic force and shear force based tip-enhanced Raman spectroscopy and imaging

Published:2007-07-06 Issue:31 Volume:18 Page:315502
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Kharintsev S S,Hoffmann G G,Dorozhkin P S,With G de,Loos J

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/18/i=31/a=315502/pdf

Reference32 articles.

1. NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH POINTED PROBES

2. Tip-enhanced optical spectroscopy

4. Near-Field Microscopy and Near-Field Optics

5. Nanophotonics

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