NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH POINTED PROBES
Author:
Affiliation:
1. The Institute of Optics, University of Rochester, Rochester, New York 14627;
2. Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899;
Abstract
Publisher
Annual Reviews
Subject
Physical and Theoretical Chemistry
Link
https://www.annualreviews.org/doi/pdf/10.1146/annurev.physchem.56.092503.141236
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