The interface state density characterization by temperature-dependent capacitance–conductance–frequency measurements in Au/Ni/n-GaN structures
Author:
Publisher
IOP Publishing
Subject
Metals and Alloys,Polymers and Plastics,Surfaces, Coatings and Films,Biomaterials,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/2053-1591/2/i=9/a=096304/pdf
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