Technological aspects of silver particle sintering for electronic packaging

Author:

Felba Jan

Abstract

Purpose This paper aims to find proper technological parameters of low-temperature joining technique by silver sintering to eventually use this technique for reliable electronic packaging. Design/methodology/approach Based on the literature and author’s own experience, the factors influencing the nanosized Ag particle sintering results were identified, and their significance was assessed. Findings It has been shown that some important technological parameters clearly influence the quality of the joints, and their choice is unambiguous, but the meaning of some parameters is dependent on other factors (interactions), and they should be selected experimentally. Originality/value The value of this research is that the importance of all technological factors was analyzed, which makes it easy to choose the technological procedures in the electronic packaging.

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering

Reference123 articles.

1. Bai, G. (2005), “Low-temperature sintering of nanoscale silver paste for semiconductor device interconnection”, PhD dissertation, Virginia Tech, Blacksburg, VA.

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3. Thermomechanical reliability of low-temperature sintered silver die attached SiC power device assembly;IEEE Transactions on Device and Materials Reliability,2006

4. High-temperature operation of sic power devices by low-temperature sintered silver die-attachment;IEEE Transactions on Advanced Packaging,2007

5. Characterization of low-temperature sintered nanoscale silver paste for attaching semiconductor devices,2005

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