An analytic method for parameter extraction of InP HBTs small-signal model

Author:

Zhang Jincan,Liu Min,Wang Jinchan,Xu Kun

Abstract

Purpose High-speed Indium Phosphide (InP) HBTs have been widely used to design high-speed analog, digital and mixed-signal integrated circuits. The purpose of this study is to propose a new parameter extraction procedure for determining an improved T-topology small-signal equivalent circuit of InP heterojunction bipolar transistors (HBTs). Design/methodology/approach The alternating current crowding effect is considered through adding the intrinsic base capacitance in the small-signal equivalent circuit. All of the circuit parameters are extracted directly without using any approximation. Findings The extraction technique is more easily understood and clearer than other extraction methods, as the equations are derived from the S-parameters by peeling peripheral elements from small-signal models to get reduced ones and extracting each equivalent-circuit parameter using each equation. Originality/value To validate the presented parameter extraction technology, an n-p-n emitter-up InP HBT was analyzed adopting the method. Excellent agreement between measured and modeled S-parameters is obtained up to 40 GHz.

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering

Reference18 articles.

1. Consistent modeling and power gain analysis of microwave SiGe HBTs in CE and CB configurations;IEEE Transactions on Microwave Theory and Techniques,2015

2. A physical, yet simple, small-signal equivalent circuit for the heterojunction bipolar transistor;IEEE Transactions on Microwave Theory and Techniques,1997

3. Direct extraction of InP/GaAsSb/InP DHBT equivalent-circuit elements from S–parameters measured at cut-off and normal bias conditions;IEEE Transactions on Microwave Theory and Techniques,2016

4. A 4.2-to-5.4 GHz stacked GaAs HBT power amplifier for C-band applications;Circuit World,2020

5. Determining the base resistance of InP HBTs: an evaluation of methods and structures;Solid-State Electronics,2019

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