Comparing different software packages for the mapping of strain from scanning precession diffraction data-Reference-Cited by-同舟云学术

Comparing different software packages for the mapping of strain from scanning precession diffraction data

Published:2021-07-30 Issue:S1 Volume:27 Page:2-5
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

MacLaren Ian,Devine Emma,Gergov Hristo,Paterson Gary,Harikrishnan K. P.,Savitzky Benjamin,Ophus Colin,Yuan Renliang,Zuo Jian-Min,Forster Kirsten,Kobe Gaja,Koppany Elizabeth,McClymont Kirsten,Narendran Anjelo,Riley David

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference7 articles.

1. Lattice strain mapping using circular Hough transform for electron diffraction disk detection

2. Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization

3. 4. Savitzky, B. H. , , arXiv e-prints, arXiv:2003.09523 (2020).

4. Interfacial sharpness and intermixing in a Ge-SiGe multiple quantum well structure

5. Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Measuring electrical properties in semiconductor devices by pixelated STEM and off-axis electron holography (or convergent beams vs. plane waves).;Micron;2024-04

2. Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patterns;npj Computational Materials;2022-12-14

3. Quantitative Strain and Topography Mapping of 2D Materials Using Nanobeam Electron Diffraction;Microscopy and Microanalysis;2022-04-01