Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization-Reference-Cited by-同舟云学术

Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization

Published:2020-09-04 Issue:5 Volume:26 Page:944-963
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Paterson Gary W.^ORCID,Webster Robert W. H.^ORCID,Ross Andrew^ORCID,Paton Kirsty A.^ORCID,Macgregor Thomas A.^ORCID,McGrouther Damien^ORCID,MacLaren Ian^ORCID,Nord Magnus^ORCID

Abstract

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference107 articles.

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