Scanning moiré fringe imaging by scanning transmission electron microscopy
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference29 articles.
1. Correction of aberrations, a promising means for improving the spatial and energy resolution of energy-filtering electron microscopes
2. Towards sub-Å electron beams
3. Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM
4. Sub-ångstrom resolution using aberration corrected electron optics
5. Direct Sub-Angstrom Imaging of a Crystal Lattice
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