In Situ Transmission Electron Microscopy Observation of 3C-SiC Heteroepitaxial Growth on Si Nanomembrane-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

In Situ Transmission Electron Microscopy Observation of 3C-SiC Heteroepitaxial Growth on Si Nanomembrane

Published:2022-08-01 Issue:S1 Volume:28 Page:1832-1833
ISSN:1435-8115
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Kim Kangsik¹,Son Seungwoo¹²,Lee Seonwoo³,Ahn Jong-Hyun³,Lee Zonghoon¹²

Affiliation:

1. Institute for Basic Science (IBS) Center for Multidimensional Carbon Materials, , Ulsan, Republic of Korea

2. Ulsan National Institute of Science and Technology (UNIST) School of Materials Science and Engineering, , Ulsan, Republic of Korea

3. Yonsei University School of Electrical and Electronic Engineering, , Seoul, Republic of Korea

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/28/S1/1832/48822390/mam1832.pdf

Reference5 articles.

1. Atomic Scale Study on Growth and Heteroepitaxy of ZnO Monolayer on Graphene

2. Spin Polarization and Magnetic Moment in Silicon Carbide Grown by the Method of Coordinated Substitution of Atoms

3. Thickness-Dependent Phonon Renormalization and Enhanced Raman Scattering in Ultrathin Silicon Nanomembranes

4. Observation of the Initial Stage of 3C-SiC Heteroepitaxial Growth on the Si Nanomembrane

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantitative monitoring of SARS-CoV-2 mediated by the intrinsic Raman signal of silicon nanoparticles and SiC@RP composite semiconductor SERS substrate;Sensors and Actuators B: Chemical;2023-11

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP