Thickness-Dependent Phonon Renormalization and Enhanced Raman Scattering in Ultrathin Silicon Nanomembranes
Author:
Affiliation:
1. School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea
2. Department of Physics, Sogang University, Seoul 04107, Republic of Korea
Funder
National Research Foundation of Korea
Publisher
American Chemical Society (ACS)
Subject
Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.7b03944
Reference42 articles.
1. Silicon-on-insulator 'gate-all-around device'
2. Flexible Phototransistors Based on Single‐Crystalline Silicon Nanomembranes
3. Observation of the Inverse Giant Piezoresistance Effect in Silicon Nanomembranes Probed by Ultrafast Terahertz Spectroscopy
4. Nanostressors and the Nanomechanical Response of a Thin Silicon Film on an Insulator
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