Charge-conservative GaN HEMT nonlinear modeling from non-isodynamic multi-bias S-parameter measurements

Abstract

AbstractGuaranteeing charge conservation of empirically extracted Gallium Nitride (GaN) High-Electron-Mobility Transistor (HEMT) models is necessary to avoid simulation issues and artifacts in the prediction. However, dispersive effects, such as thermal and charge-trapping phenomena, may compromise the model extraction flow resulting in poor model accuracy. Although GaN HEMT models should be extracted, in principle, from an isodynamic dataset, this work deals with the systematic identification of an approximate, yet most suitable, charge-conservative empirical model from standard multi-bias S-parameters, i.e., from non-isodynamic data. Results show that the obtained model maintains a reasonable accuracy in predicting both small- and large-signal behavior, while providing the benefits of charge conservation.