Automatic Extraction of Measurement-Based Large-Signal FET Models by Nonlinear Function Sampling

Author:

Martin-Guerrero Teresa M.ORCID,Santarelli AlbertoORCID,Gibiino Gian PieroORCID,Traverso Pier AndreaORCID,Camacho-Penalosa CarlosORCID,Filicori Fabio

Funder

Spanish Ministerio de Ciencia, Innovación y Universidades in the frame of Salvador de Madariaga Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Review of RF Device Behavior Model: Measurement Techniques, Applications, and Challenges;Micromachines;2023-12-25

2. Varactor Characterization Procedure for Large-Signal High-Frequency Applications;2023 18th European Microwave Integrated Circuits Conference (EuMIC);2023-09-18

3. GaN HEMT Modeling versus Bias Point and Gate Width;2023 58th International Scientific Conference on Information, Communication and Energy Systems and Technologies (ICEST);2023-06-29

4. Analysis of Trapping Effect on Large-Signal Characteristics of GaN HEMTs Using X-Parameters and UV Illumination;Micromachines;2023-05-08

5. Accurate and Effective Nonlinear Behavioral Modeling of a 10-W GaN HEMT Based on LSTM Neural Networks;IEEE Access;2023

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