Multibeam Electron Diffraction
Author:
Abstract
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference57 articles.
1. Electron diffraction using transmission electron microscopy
2. Chapter 2 Present and Future Hexapole Aberration Correctors for High-Resolution Electron Microscopy
3. Detection of Ring and Adatom Defects in Activated Disordered Carbon via Fluctuation Nanobeam Electron Diffraction
4. The Theoretical Resolution Limit of the Electron Microscope
5. A streaming multi-GPU implementation of image simulation algorithms for scanning transmission electron microscopy
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