The Reduction of Pileup Effects in Spectra Collected with Silicon Drift Detectors-Reference-Cited by-同舟云学术

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The Reduction of Pileup Effects in Spectra Collected with Silicon Drift Detectors

Published:2008-08 Issue:S2 Volume:14 Page:1260-1261
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Elam T,Anderhalt R,Sandborg A,Nicolosi J,Redfern D

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray microanalysis: the state of the art of SDD detectors and WDS systems on scanning electron microscopes (SEM);IOP Conference Series: Materials Science and Engineering;2012-03-07

2. Smart pile-up consideration for evaluation of high count rate EDS spectra;IOP Conference Series: Materials Science and Engineering;2012-03-07

3. Evaluating the Performance of a Commercial Silicon Drift Detector for X-ray Microanalysis;Microscopy Today;2011-04-28

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