Smart pile-up consideration for evaluation of high count rate EDS spectra
Author:
Publisher
IOP Publishing
Subject
General Medicine
Link
http://stacks.iop.org/1757-899X/32/i=1/a=012008/pdf
Reference6 articles.
1. Pile-Up Correction for Improved Accuracy and Speed of X-Ray Analysis
2. The Reduction of Pileup Effects in Spectra Collected with Silicon Drift Detectors
3. Characterizing EDS Coincidence Detection At High Rates For Low Energies
4. EDX-Spectra Simulation in Electron Probe Microanalysis. Optimization of Excitation Conditions and Detection Limits
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering;Progress in Materials Science;2021-07
2. Electron probe microanalysis: A review of recent developments and applications in materials science and engineering;Progress in Materials Science;2021-02
3. Development and validation of standardless and standards-based X-ray microanalysis;IOP Conference Series: Materials Science and Engineering;2020-07-01
4. Specimen homogeneity requirements for EDS in high count rate mode;IOP Conference Series: Materials Science and Engineering;2014-03-05
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