Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope-Reference-Cited by-同舟云学术

Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope

Published:2006-10-11 Issue:6 Volume:12 Page:442-455
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Müller Heiko,Uhlemann Stephan,Hartel Peter,Haider Maximilian

Abstract

Aberration correctors using hexapole fields have proven useful to correct for the spherical aberration in electron microscopy. We investigate the limits of the present design for the hexapole corrector with respect to minimum probe size for the scanning transmission electron microscope and discuss several ways in which the design could be improved by rather small and incremental design changes for the next generation of advanced probe-forming systems equipped with a gun monochromator.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

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