Author:
Erni Rolf,Freitag Bert,Hartel Peter,Müller Heiko,Tiemeijer Peter,van der Stam Michiel,Stekelenburg Mike,Hubert Dominique,Specht Petra,Garibay-Febles Vincente
Abstract
Planar defects in a polycrystalline diamond film were studied by
high-resolution transmission electron microscopy (HRTEM) and
high-resolution scanning transmission electron microscopy (STEM). In both
modes, sub-Ångström resolution was achieved by making use of
two aberration-corrected systems; a TEM and a STEM
CS-corrected microscope, each operated at 300 kV. For
the first time, diamond in 〈110〉 zone-axis orientation was
imaged in STEM mode at a resolution that allows for resolving the atomic
dumbbells of carbon at a projected interatomic distance of 89 pm. Twin
boundaries that show approximately the Σ3 CSL structure reveal at
sub-Ångström resolution imperfections; that is, local
distortions, which break the symmetry of the ideal Σ3 type twin
boundary, are likely present. In addition to these imperfect twin
boundaries, voids on the atomic level were observed. It is proposed that
both local distortions and small voids enhance the mechanical toughness of
the film by locally increasing the critical stress intensity factor.
Publisher
Cambridge University Press (CUP)
Cited by
12 articles.
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