1. Miller, G.L., Lang, D.V., and Kimerling, L.C., Annu. Rev. Mater. Sci., 1977, vol. 7, p. 377.
2. Lang, D.V., J. Appl. Phys., 1974, vol. 45, p. 3023.
3. Berman, L.S. and Lebedev, A.A., Emkostnaya spektroskopiya glubokikh tsentrov v poluprovodnikakh (Capacity Spectroscopy of Deep Centers in Semiconductors), Leningrad: Nauka, 1981, p. 176.
4. Zubkov, V.I., Diagnostika poluprovodnikovykh nanogeterostruktur metodami spektroskopii admittansa (Diagnostics of Semiconductor Nanoheterostructures by Means of Admittance Spectroscopy), St. Petersburg: Elmor, 2007, p. 167.
5. Oldham, W.G. and Naik, S.S., Solid State Electron., 1972, vol. 15, p. 1085.