An automated system based on cryogenic probe station for integrated studies of semiconductor light-emitting structures and wafers in the range of 15 to 475 K
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Published:2015-05
Issue:3
Volume:44
Page:203-209
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ISSN:1063-7397
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Container-title:Russian Microelectronics
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language:en
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Short-container-title:Russ Microelectron
Author:
Zubkov V. I.,Kucherova O. V.,Yakovlev I. N.,Solomonov A. V.
Publisher
Pleiades Publishing Ltd
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference18 articles.
1. Kucherova, O.V., Zubkov, V.I., Tsvelev, E.O., et al., Inorg. Mat., 2011, vol. 47, no. 14, p. 1574. 2. Zubkov, V.I., Pikhtin, A.N., and Solomonov, A.V., Fiz. Tekh. Poluprovodn. (S.-Peterburg), 1989, vol. 23, no. 1, p. 64. 3. Zubkov, V.I., Kapteyn, S.M.A., Solomonov, A.V., and Bimberg, D., J. of Physics: Condens. Matter., 2005, vol. 17, p. 2435. 4. Zubkov, V.I., Shulgunova, I.S., Solomonov, A.V., et al., Direct observation of charge-carrier capture in an array of self-assembled InAs/GaAs quantum dots, Bull. Russ. Acad. Sci.: Phys., 2007, vol. 71, no. 1, p. 106. 5. Sangeeth, S.C.S., Kannan, R., Pillai, V.K., and Menon, R., J. Appl. Phys., 2012, vol. 112, p. 053706.
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