Ellipsometric in Situ Studies of the Growth of ZnS Film
Author:
Affiliation:
1. a Solar Energy Research Center, Scientific Research Council, P.O. Box 13026, Jadiriyah, Baghdad, Iraq
Publisher
Informa UK Limited
Subject
Electronic, Optical and Magnetic Materials
Link
https://www.tandfonline.com/doi/pdf/10.1080/713822078
Reference13 articles.
1. A vacuum automatic ellipsometer for principal angle of incidence measurement
2. The influence of deposition parameters on the optical properties and growth of ZnS films
3. YAMAMOTO , M. submitted for publication
4. Dielectric Thin Films*
5. Dielectric Anomaly in ZnS Films
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1. Effects of Temperature, Pressure, and Metal Promoter on the Recrystallized Structure and Optical Transmission of Chemical Vapor Deposited Zinc Sulfide;Journal of the American Ceramic Society;2009-08
2. Adsorption-ellipsometry method of studying the optical profile, thickness, and porosity of thin films;Journal of Optical Technology;1999-07-01
3. Comparison of adhesion and intrinsic stress of chopped and non-chopped ZnS thin films;Materials Chemistry and Physics;1997-06
4. Aging Reduction of ZnS Films Using Chopping Technique;Japanese Journal of Applied Physics;1990-12-20
5. Automatic rotating element ellipsometers: Calibration, operation, and real‐time applications;Review of Scientific Instruments;1990-08
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