A vacuum automatic ellipsometer for principal angle of incidence measurement
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference7 articles.
1. Refractive indices of zinc sulfide and cryolite in multilayer stacks
2. Principal angle-of-incidence ellipsometry
3. The Optical Constants of Several Metals in Vacuum*
4. A Precision Ellipsometer without Employing a Compensator
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3. Spectroscopic ellipsometer based on direct measurement of polarization ellipticity;Applied Optics;2011-06-14
4. Return-path, multiple-principal-angle, internal-reflection ellipsometer for measuring IR optical properties of aqueous solutions;Applied Optics;2010-08-24
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