Author:
Berlin Bengt,Brodsky Joel,Clifford Peter
Subject
Statistics, Probability and Uncertainty,Statistics and Probability
Cited by
23 articles.
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1. An analysis of one-shot devices with multiple components;Developments in Reliability Engineering;2024
2. Bayes analysis of one-shot device testing data with correlated failure modes using copula models;Communications in Statistics - Simulation and Computation;2023-12-07
3. Carcinogenesis: Mechanisms and Evaluation;Haschek and Rousseaux's Handbook of Toxicologic Pathology;2022
4. Bibliography;Accelerated Life Testing of One‐shot Devices;2021-02-26
5. Copula models for one-shot device testing data with correlated failure modes;Communications in Statistics - Theory and Methods;2020-02-10