Copula models for one-shot device testing data with correlated failure modes-Reference-Cited by-同舟云学术

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Copula models for one-shot device testing data with correlated failure modes

Published:2020-02-10 Issue:16 Volume:50 Page:3875-3888
ISSN:0361-0926
Container-title:Communications in Statistics - Theory and Methods
language:en
Short-container-title:Communications in Statistics - Theory and Methods

Author:

Ling M. H.¹,Chan P. S.²,Ng H. K. T.³,Balakrishnan N.⁴

Affiliation:

1. Department of Mathematics and Information Technology, The Education University of Hong Kong, Hong Kong, China

2. Department of Statistics, The Chinese University of Hong Kong, Hong Kong, China

3. Department of Statistical Science, Southern Methodist University, Dallas, Texas, USA

4. Department of Mathematics and Statistics, McMaster University, Hamilton, Ontario, Canada

Funder

Education University of Hong Kong

Research Grants Council of the Hong Kong Special Administrative Region, China

Publisher

Informa UK Limited

Subject

Statistics and Probability

Link

https://www.tandfonline.com/doi/pdf/10.1080/03610926.2020.1725827

Reference30 articles.

1. Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress

2. Gamma lifetimes and one-shot device testing analysis

3. EM algorithm for one-shot device testing with competing risks under exponential distribution

4. A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On the application of inverted Dirichlet distribution for reliability inference of completely censored components with dependence structure;Computers & Industrial Engineering;2024-10

2. An analysis of one-shot devices with multiple components;Developments in Reliability Engineering;2024

3. Bayes analysis of one-shot device testing data with correlated failure modes using copula models;Communications in Statistics - Simulation and Computation;2023-12-07

4. A novel adaptive deployment method for the single-target tracking of mobile wireless sensor networks;Reliability Engineering & System Safety;2023-06

5. Accelerated Life Testing Data Analyses for One-Shot Devices;Springer Handbook of Engineering Statistics;2023

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