Subject
Electrical and Electronic Engineering
Cited by
10 articles.
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1. Observability-aware Directed Test Generation for Soft Errors and Crosstalk Faults;2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems;2013-01
2. VLSI interconnects and their testing: prospects and challenges ahead;Journal of Engineering, Design and Technology;2011-03-29
3. ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2009-09
4. Test Generation for Crosstalk Glitches Considering Multiple Coupling Effects;16th Asian Test Symposium (ATS 2007);2007-10
5. Selection of Crosstalk-Induced Faults in Enhanced Delay Test;Journal of Electronic Testing;2005-04