Author:
Albers Willem,Arts Gerda R.J.,Kallenberg Wilbert C.M.
Subject
Applied Mathematics,Modeling and Simulation,Statistics and Probability
Cited by
4 articles.
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1. Spline‐Based Drift Analysis for the Reliability of Semiconductor Devices;Advanced Theory and Simulations;2021-07-10
2. Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data;Quality and Reliability Engineering International;2017-10-30
3. Engineering Statistics;Wiley StatsRef: Statistics Reference Online;2014-11-17
4. Engineering Statistics;Encyclopedia of Statistical Sciences;2006-08-15