Design of reliable universal QCA logic in the presence of cell deposition defect
Author:
Affiliation:
1. Department of CSE, NIT, Durgapur, India
2. Department of CST, IIEST, Shibpur, India
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/00207217.2017.1293174
Reference29 articles.
1. Coplanar Full Adder in Quantum-Dot Cellular Automata via Clock-Zone-Based Crossover
2. Designing quantum-dot cellular automata counters with energy consumption analysis
3. Architectures for silicon nanoelectronics and beyond
4. USE: A Universal, Scalable, and Efficient Clocking Scheme for QCA
5. Defect characterization in coupled majority-minority QCA gate
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