Low-frequency conductance of thermally grown SiO2films
Author:
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering
Link
http://www.tandfonline.com/doi/pdf/10.1080/00207217808900871
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4. A bibliography of metal-insulator-semiconductor studies
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1. Damage to n-MOSFETs from electrical stress Relationship to processing damage and impact on device reliability;Microelectronics Reliability;1998-04
2. Electrical-stress simulation of plasma-damage to submicron metal–oxide–silicon field-effect transistors: Comparison between direct current and alternating current stresses;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1997-05
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5. Transistor Surface Effects Responsible for Anomalous Third-Order Intermodulation Distortion in Undersea Cable Telephone System;Bell System Technical Journal;1979-11
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