Radiation-hardened metal-oxide-semiconductor structure-Reference-Cited by-同舟云学术

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Radiation-hardened metal-oxide-semiconductor structure

Published:1994-04 Issue:4 Volume:69 Page:235-239
ISSN:0950-0839
Container-title:Philosophical Magazine Letters
language:en
Short-container-title:Philosophical Magazine Letters

Author:

Kaschieva S.

Publisher

Informa UK Limited

Subject

Condensed Matter Physics

Link

http://www.tandfonline.com/doi/pdf/10.1080/09500839408241598

Reference11 articles.

1. Radiation‐induced charge trapping in implanted buried oxides

2. A model for radiation damage in metal-oxide-semiconductor structures

3. Radiation-Induced Defects in SiO2 as Determined with XPS

4. The radiation hardness property of dry oxide grown by postoxidation cooling in oxygen ambient

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