ELM and KELM based software defect prediction using feature selection techniques
Author:
Affiliation:
1. University School of Information and Communication Technology, Guru Gobind Singh Indraprastha University, Sector - 16C, Dwarka Delhi 110078, India
Publisher
Informa UK Limited
Link
https://www.tandfonline.com/doi/pdf/10.1080/02522667.2019.1637999
Reference18 articles.
1. ATTRIBUTE SELECTION USING ROUGH SETS IN SOFTWARE QUALITY CLASSIFICATION
2. Benchmarking Classification Models for Software Defect Prediction: A Proposed Framework and Novel Findings
3. Extreme learning machine: Theory and applications
4. An Insight into Extreme Learning Machines: Random Neurons, Random Features and Kernels
5. Software Metrics: Progress after 25 Years?
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