Stress and strain around grain-boundary dislocations measured by high-resolution electron microscopy
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics
Link
http://www.tandfonline.com/doi/pdf/10.1080/14786430600743876
Reference24 articles.
1. Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy
2. Dislocation Models of Crystal Grain Boundaries
3. Nanoscale waviness of low-angle grain boundaries
4. Atomic positions around misfit dislocations on a planar heterointerface
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