Feature extraction for defect classification and yield enhancement in color filter and micro-lens manufacturing: An empirical study
Author:
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Control and Systems Engineering
Link
http://www.tandfonline.com/doi/pdf/10.1080/21681015.2013.869512
Reference21 articles.
1. A Computational Approach to Edge Detection
2. Analysis of a supply chain partnership with revenue sharing
3. A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligence
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