Integrating content-based image retrieval and deep learning to improve wafer bin map defect patterns classification
Author:
Affiliation:
1. Department of Industrial Engineering and Engineering Management, National Tsing Hua University, Hsinchu, Taiwan
Funder
Ministry of Science and Technology, Taiwan
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Control and Systems Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/21681015.2022.2074155
Reference48 articles.
1. A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligence
2. Technical service platform planning based on a company’s competitive advantage and future market trends: A case study of an IC foundry
3. Sustainable industrial and operation engineering trends and challenges Toward Industry 4.0: a data driven analysis
4. UNISON analysis to model and reduce step-and-scan overlay errors for semiconductor manufacturing
5. Wafer fault detection and key step identification for semiconductor manufacturing using principal component analysis, AdaBoost and decision tree
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